Scanning Transmission Electron Microscopy (STEM) Detector
Our STEM Detector offers the ability to use either the EM-30 Series Tabletop SEM or the CX-200plus SEM to perform STEM analysis with standard TEM grids. With this optional accessory and our 30kV beam energy, your SEM can serve additional roles in the laboratory. The STEM detector mounts to the SEM via a side port. When not used, the STEM detector retracts and tilts 90° out of view for standard SEM analysis.
Unlike other STEM modules that use a platinum mirror to collect an image with the SE detector, the STEM module provides a true detector positioned below the TEM grid sample. The detector can collect both Bright Field (BF) and Dark Field (DF) images.
The STEM Accessory includes both the detector and a special TEM grid holder that mounts directly to the SEM Stage. The TEM grid holder accomodates up to 4 separate TEM grids. The holder is also designed also accommodate EDS analysis without any obstruction or special adjustment.
One of the most useful applications for the STEM module is for determining Size and Morphology of Nano-Particles dispersed onto TEM grids with carbon support films or with Silicon Nitride support films.
While the STEM adapter can be used for traditional thin section tissue analysis, the 30kV beam energy may require thinner tissue sections than traditional Transmission Electron Microscopes (TEM) having beam energies of 80kV to 200kV. An Ultra-Microtome is typically necessary to prepare adequate tissue samples. Still, the STEM module with the SEM can be used for pre-screening samples prior to TEM analysis, basic TEM analysis or as practical teaching tool for TEM analysis.