SEM Accessories – Sample Preparation – EDS – Software

/SEM Accessories – Sample Preparation – EDS – Software
SEM Accessories – Sample Preparation – EDS – Software 2018-11-24T13:35:33+00:00

For Consumable SEM Accessories and Supplies like Stubs, Conductive Tape, Filaments and more — please visit our MICROSCOPY LINKS page.

Accessories for SEM

Cold Stage and Critical Point Dryers (CPD) - Tabletop SEM Accessories

Cold Stage

Cold Stage sample platform for the EM-30 improves imaging of moist or biological samples, -25°C to 50°C temperature range

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STEM Detector for Desktop SEM

STEM Detector

STEM Module with dedicated imaging detector and TEM grid holder for 4 grids with EDS compatibility

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Anti-Vibration Platform - SEM Accessories

Vibration Isolation Platforms

Vibration Isolation platforms assist high magnification imaging by suppressing ambient vibrations. Multiple models available from Herzan and Daeil Systems.

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STEM Detector for SEM

Chamber Plasma Cleaner

PIE Scientific Glow Discharge system for direct chamber clean, removeable for sample cleaning

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Sample Preparation Tools for SEM

Compact Sputter Coaters for Tabletop SEM

Sputter Coater

Improves High Magnification imaging for Non-Conductive specimens in Scanning Electron Microscopes

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Compact Sputter Coaters for Tabletop SEM

Sputter / Carbon Coater

Denton Desk V Sputter and Carbon Coater with Tilt-Rotate for Non-Conductive specimens in Scanning Electron Microscopes

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Cross Section Polisher for SEM sample preparation

Ion Mill Polisher

NEW CP-8000 Cross Section Polisher utilizing an Argon Ion Mill prepares samples for critical cross section analysis

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Cold Stage and Critical Point Dryers (CPD) for Tabletop SEM

Critical Point Dryer

Critical Point Dryers for improved imaging of moist samples

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SEM Accessories – Image Analysis Software for Microscopy

MountainsMap SEM by DigitalSurf

MountainsMap by DigitalSurf

Create 3D surface maps, colorized images, image stitching and more

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MIPAR Image Analysis software

MIPAR Image Analysis

MIPAR Image Analysis software for statistical feature analysis of Particles, Pores, Fibers and more

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MIPAR Image Analysis software

Quartz PCI CFR

Add 21 CFR Part 11 compliance to your SEM workflow

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Other SEM Accessories and Tools:

For additional SEM Accessories and Sample Preparation Supplies and Tools, we suggest visiting our recommend supplier – Rave Scientific