Oxford Xplore EDS – AZtecOne for Full-Size SEM
The Xplore EDS series from Oxford Instruments is available in 2 models for the CX-200 series Full-Size SEM utilizing Oxford’s renowned AZtec software platform with 4 levels of software for simple to advanced Elemental Micro-Analysis. The Xplore model is available in 2 sizes – an economical 15mm2 detector with AZtecONE software or a 30mm2 detector with one of 3 AZtecLIVE operating software platforms. These affordable EDS compliments Oxford’s flagship EDS, the Ultim® Max series which is also available for the CX-200plus.
Adding Oxford EDS to your SEM turns it into a very powerful analytical tool allowing a multitude of capabilities using advanced micro-analysis features for elemental analysis. With the an optimal take-off angle, the EDS signal is collected at an optimum solid angle.
Main Specifications of Oxford AZtecOne EDS
- High speed SDD Dectector (No LN2 required)
- Energy resolution: Less than 129 eV (at Mn Ka)
- Detector area: 15 or 30 mm²
- Element detection range: Be(4) – Am(95)
- Maximum input count rate: > 1 million cps
- Software: Qualitative or Quantitative Analysis
- Analysis Modes: Point, Circle, Polygon, Line Scan, Mapping
- Optional Advanced Software for automated analysis
Point / Area Composition
- The software has easy to use features for Composition Analysis at Points, Rectangles, Circles and Polygons
- Fast and accurate qualitative or quantitative analysis with standard-less quantification is standard
- Tru-Q® algorithms optimized to improve quantified results
Mapping
- Fast and high resolution mapping analysis with Oxford's datacube
- Mapping provides the function of analyzing the distribution of elements
- Maps of individual element distribution can be broken out and saved separately
- Various user settings for saving formats, colors, depth, filters, and more
Line Scan
- Draw ROI (region of interest) with a line and analyze elements along that line
- Easy to compare the elemental difference along ROI with line profile graph
- Very useful for cross-section thickness analysis of multi-layer samples including the mixing zone
- Various user settings for saving formats, colors, line scan width, filters and more
Reporting
- Quick and easy reporting functionality
- One-click saving of reports in MS Word