Oxford Xplore EDS – AZtecOne for Full-Size SEM

The Xplore EDS series from Oxford Instruments is available in 2 models for the CX-200 series Full-Size SEM utilizing Oxford’s renowned AZtec software platform with 4 levels of software for simple to advanced Elemental Micro-Analysis.  The Xplore model is available in 2 sizes – an economical 15mm2 detector with AZtecONE software or a 30mm2 detector with one of 3 AZtecLIVE operating software platforms.  These affordable EDS compliments Oxford’s flagship EDS, the Ultim® Max series which is also available for the CX-200plus.

Adding Oxford EDS to your SEM turns it into a very powerful analytical tool allowing a multitude of capabilities using advanced micro-analysis features for elemental analysis. With the an optimal take-off angle, the EDS signal is collected at an optimum solid angle.

Oxford Xplore EDS
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Hardware

Main Specifications of Oxford AZtecOne EDS

  1. High speed SDD Dectector (No LN2 required)
  2. Energy resolution: Less than 129 eV (at Mn Ka)
  3. Detector area: 15 or 30 mm² 
  4. Element detection range: Be(4) – Am(95)
  5. Maximum input count rate: > 1 million cps
  6. Software: Qualitative or Quantitative  Analysis
  7. Analysis Modes:  Point, Circle, Polygon, Line Scan, Mapping
  8. Optional Advanced Software for automated analysis

To learn more about the Oxford Xplore EDS, visit Oxford's website:

Oxford XPLORE website

Software

Point / Area Composition

  • The software has easy to use features for Composition Analysis at Points, Rectangles, Circles and Polygons
  • Fast and accurate qualitative or quantitative analysis with standard-less quantification is standard
  • Tru-Q® algorithms optimized to improve quantified results

Mapping

  • Fast and high resolution mapping analysis with Oxford's datacube
  • Mapping provides the function of analyzing the distribution of elements
  • Maps of individual element distribution can be broken out and saved separately
  • Various user settings for saving formats, colors, depth, filters, and more

Line Scan

  • Draw ROI (region of interest) with a line and analyze elements along that line
  • Easy to compare the elemental difference along ROI with line profile graph
  • Very useful for cross-section thickness analysis of multi-layer samples including the mixing zone
  • Various user settings for saving formats, colors, line scan width, filters and more

Reporting

  • Quick and easy reporting functionality
  • One-click saving of reports in MS Word
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