Scanning Electron Microscopes

Desktop SEM EM-30 Plus

EM-30 Plus

EM-30N

EM-30 LE

High Resolution Desktop SEM with either Tungsten or CeB6 electron source and standard motorized 3-Axis XYT stage.

More Info >>>

Desktop SEM Em-30AX Plus

EM-30AX Plus

EM-30AXN

EM-30AX LE

The EM-30 series SEM expanded to include an integrated EDS Micro-Analysis system from Bruker, Oxford Instruments or EDAX

More Info >>>

CX-200plus Full-Size Scanning Electron Microscope

CX-200plus

Advanced full-size SEM with automated 5-Axis XYZRT stage, 3nm Resolution, and max 300,000X magnification.  Standard with SE and BSE image detectors, plus Chamber View Camera. Numerous EDS, EBSD, CL and automated feature analysis capabilities.

More Info >>>

Accessories for SEM

STEM Detector for Desktop SEM

STEM Detector

STEM Module with dedicated imaging detector and TEM grid holder for 4 grids with EDS compatibility

More Info >>>

Cold Stage and Critical Point Dryers (CPD) for Benchtop SEM

Cold Stage

Cold Stage sample platform for the EM-30 improves imaging of moist or biological samples, -25°C to 50°C temperature range

More Info >>>

Anti-Vibration Supports for Desktop SEM

Vibration Isolation Platforms

Vibration Isolation platforms assist high magnification imaging by suppressing ambient vibrations. Multiple models available from AMTek and Herzan.

More Info >>>

EDS Micro-Analysis Options for SEM

Bruker Xflash EDS for Desktop SEM

Bruker EDS for Desktop SEM

Xflash® 630 EDS for Desktop SEM with 30mm² SDD and Esprit Compact software

More Info >>>

Oxford AZtecOne EDS for Desktop SEM

Oxford EDS for Desktop SEM

AZtecOne SDD EDS for Desktop SEM with 30mm² detector and Aztec Software

More Info >>>

EDAX Element EDS for Desktop SEM

EDAX EDS for Desktop SEM

Element SDD EDS for Desktop SEM with 25mm² detector and APEX™ Software

More Info >>>

EDAX Element EDS

Oxford EDS Micro-Analysis

AZtec X-MAXn SDD EDS with 20, 50 or 80mm² detector and AztecEnergy Software

More Info >>>

EDAX Element EDS

Oxford EDS Micro-Analysis

Economical AZtecOneXT SDD EDS with 10mm² detector and AztecOne Software

More Info >>>

Bruker Xflash EDS

Bruker EDS Micro-Analysis

Xflash® 630N EDS with 30mm² SDD and Esprit Compact software

More Info >>>

EDAX Element EDS

EDAX EDS Micro-Analysis

Element PV6500V SDD EDS with 25mm² detector and APEX™ Software

More Info >>>

Sample Preparation Tools for SEM

Compact Sputter Coaters for Desktop SEM

Sputter Coater

Improves High Magnification imaging for Non-Conductive specimens in Scanning Electron Microscopes

More Info >>>

Sputter Coaters for Desktop SEM

Sputter / Carbon Coater

Denton Desk V Sputter and Carbon Coater with Tilt-Rotate for Non-Conductive specimens in Scanning Electron Microscopes

More Info >>>

Cross Section Polisher for SEM sample preparation

Cross Section Polisher

NEW CP-8000 Cross Section Polisher utilizing an Argon Ion Mill prepares samples for critical cross section analysis

More Info >>>

Cold Stage and Critical Point Dryers (CPD) for Tabletop SEM

Critical Point Dryer

Critical Point Dryers for improved imaging of moist samples

Contact Us for more info

Software for SEM

MountainsMap SEM by DigitalSurf

MountainsMap by DigitalSurf

Create 3D surface maps, colorized images, image stitching and more

More Info >>>

MIPAR Image Analysis software

MIPAR Image Analysis

MIPAR Image Analysis software for statistical feature analysis of Particles, Pores, Fibers and more

More Info >>>

MIPAR Image Analysis software

ImagePro Image Analysis

ImagePro Image Analysis software for statistical feature analysis of Particles, Pores, FIBERS and more

More Info >>>

MIPAR Image Analysis software

Quartz PCI CFR

Add 21 CFR Part 11 compliance to your SEM workflow

More Info >>>