Full-Size Scanning Electron Microscope (SEM) systems

The COXEM Series of full-size floor model Scanning Electron Microscope (SEM) systems provide a broad range of capabilities for higher magnification and multiple ports for added analytical functionality such as EDS, EBSD, WDS, STEM, Cold Stage, Sample Transfer systems and more.

CX-200plus Full-Size Scanning Electron Microscope

CX-200plus

Advanced full-size SEM with automated 5-Axis XYZRT stage, 3nm Resolution, and max 300,000X magnification.  Standard with SE and BSE image detectors, plus Chamber View Camera. Numerous EDS, EBSD, CL and automated feature analysis capabilities.

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Automated Particle Feature Analysis

Feature and Particle Analysis

Automated Feature and Particle Analysis for ASTM and ISO compliant analytical workflows for Steel, Gunshot Residue (GSR), Cleanliness, Equipment Monitoring, Automotive, Aerospace, Mining, Geology and Pharmaceutical applications including Large Area Mapping

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Tabletop SEM
Tabletop SEM

Accessories for Full-Size Scanning Electron Microscope systems

STEM Detector for CX-200plus full-size Scanning Electron Microscope

STEM Detector

True retractable STEM detector plus TEM grid holder for 4 grids

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Anti-Vibration Supports for floor model Scanning Electron Microscope

Vibration Isolation Platform

Vibration Isolation platforms improve high magnification imaging above 20,000X

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Quorum Tech AirLock for sample exchange

Sample Exchange Airlock

Quorum Tech’s Ambient and Cryo sample exchange system for preventing air exposure to samples

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Chamber Plasma Cleaner

Vacuum Sciences Glow Discharge system for direct chamber clean, removeable for sample cleaning

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EDS Micro-Analysis Options

Oxford Ultim Max EDS

Oxford EDS Micro-Analysis

AZtec Ultim® Max SDD EDS with 40, 65, 100 or 170mm² detector and AztecLive Software

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Oxford AZtecOneXT EDS for Scanning Electron Microscope

Oxford EDS Micro-Analysis

Economical X-ACT or X-MaxN SDD EDS with 10 or 20 mm² detector and AztecOne Software

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Bruker Xflash EDS for Scanning Electron Microscope

Bruker EDS Micro-Analysis

Xflash® 630N EDS with 30mm² SDD and Esprit Compact software

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EDAX Element EDS for Scanning Electron Microscope

EDAX EDS Micro-Analysis

Element PV6500V SDD EDS with 25mm² detector and APEX™ Software

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Sample Preparation Tools for SEM

Compact Sputter Coaters for Scanning Electron Microscope

Sputter Coater

Improves High Magnification imaging for Non-Conductive specimens in Scanning Electron Microscopes

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Sputter Coaters for Scanning Electron Microscope

Sputter / Carbon Coater

microPREP DSR Sputter and DCR Carbon Coater with Tilt-Rotate for Non-Conductive specimens in Scanning Electron Microscopes

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Cross Section Polisher for SEM sample preparation

Ion Mill Polisher

NEW CP-8000 Cross Section Polisher utilizing an Argon Ion Mill prepares samples for critical cross section analysis

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Cold Stage and Critical Point Dryers (CPD) for Scanning Electron Microscopes

Critical Point Dryer

Critical Point Dryers for improved imaging of moist samples

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Software for SEM

MountainsMap SEM by DigitalSurf

MountainsMap by DigitalSurf

Create 3D surface maps, colorized images, image stitching and more

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MIPAR Image Analysis software

MIPAR Image Analysis

MIPAR Image Analysis software for statistical feature analysis of Particles, Pores, Fibers and more

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MIPAR Image Analysis software

ImagePro Image Analysis

ImagePro Image Analysis software for statistical feature analysis of Particles, Pores, FIBERS and more

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MIPAR Image Analysis software

Quartz PCI CFR

Add 21 CFR Part 11 compliance to your SEM workflow

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