The COXEM Series of full-size floor model Scanning Electron Microscope (SEM) systems provide a broad range of capabilities for higher magnification and multiple ports for added analytical functionality such as EDS, EBSD, WDS, STEM, Cold Stage, Sample Transfer systems and more.
CX-200plus
Advanced full-size SEM with automated 5-Axis XYZRT stage, 3nm Resolution, and max 300,000X magnification. Standard with SE and BSE image detectors, plus Chamber View Camera. Numerous EDS, EBSD, CL and automated feature analysis capabilities.
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Feature and Particle Analysis
Automated Feature and Particle Analysis for ASTM and ISO compliant analytical workflows for Steel, Gunshot Residue (GSR), Cleanliness, Equipment Monitoring, Automotive, Aerospace, Mining, Geology and Pharmaceutical applications including Large Area Mapping
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Sputter Coater
Improves High Magnification imaging for Non-Conductive specimens in Scanning Electron Microscopes
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Sputter / Carbon Coater
Denton Desk V Sputter and Carbon Coater with Tilt-Rotate for Non-Conductive specimens in Scanning Electron Microscopes
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