Full-Size Scanning Electron Microscope (SEM) systems

The COXEM Series of full-size floor model Scanning Electron Microscope (SEM) systems provide a broad range of capabilities for higher magnification and multiple ports for added analytical functionality such as EDS, EBSD, WDS, STEM, Cold Stage, Sample Transfer systems and more.

CX-200plus Full-Size Scanning Electron Microscope

CX-200plus

Advanced full-size SEM with automated 5-Axis XYZRT stage, 3nm Resolution, and max 300,000X magnification.  Standard with SE and BSE image detectors, plus Chamber View Camera. Numerous EDS, EBSD, CL and automated feature analysis capabilities.

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Automated Particle Feature Analysis

Feature and Particle Analysis

Automated Feature and Particle Analysis for ASTM and ISO compliant analytical workflows for Steel, Gunshot Residue (GSR), Cleanliness, Equipment Monitoring, Automotive, Aerospace, Mining, Geology and Pharmaceutical applications including Large Area Mapping

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