The COXEM Series of full-size floor model Scanning Electron Microscope (SEM) systems provide a broad range of capabilities for higher magnification and multiple ports for added analytical functionality such as EDS, EBSD, WDS, STEM, Cold Stage, Sample Transfer systems and more.

CX-200plus
Advanced full-size SEM with automated 5-Axis XYZRT stage, 3nm Resolution, and max 300,000X magnification. Standard with SE and BSE image detectors, plus Chamber View Camera. Numerous EDS, EBSD, CL and automated feature analysis capabilities.
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Sputter Coater
Improves High Magnification imaging for Non-Conductive specimens in Scanning Electron Microscopes
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Sputter / Carbon Coater
microPREP DSR Sputter and DCR Carbon Coater with Tilt-Rotate for Non-Conductive specimens in Scanning Electron Microscopes
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Ion Mill Polisher
NEW CP-8000 Cross Section Polisher utilizing an Argon Ion Mill prepares samples for critical cross section analysis
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MountainsMap by DigitalSurf
Create 3D surface maps, colorized images, image stitching and more
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MIPAR Image Analysis
MIPAR Image Analysis software for statistical feature analysis of Particles, Pores, Fibers and more
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ImagePro Image Analysis
ImagePro Image Analysis software for statistical feature analysis of Particles, Pores, FIBERS and more
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Quartz PCI CFR
Add 21 CFR Part 11 compliance to your SEM workflow
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