Scanning Electron Microscopes and Sample Preparation Tools

EM-30 Series Tabletop Scanning Electron Microscopes

Scanning

Electron

Microscopes

Tabletop and Full-Size SEM systems with EDS from industry leading suppliers like Oxford Instruments and Bruker Nano

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Vacuum Sputter and Carbon Coating systems

Sample

Coaters

for SEM

Low and High Vacuum Sputter and Carbon Coaters, Advanced multi-source Sputter and Thermal Evaporation Coating Systems

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Desktop Thermal Evaporator

Thin Film

Deposition

Tools

High Vacuum multiple source Thermal Evaporation and Sputter Coating Systems for Thin Film Deposition Research

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Laser Micro Machining for FIB Workflow APT TEM XRM sample preparation

microPREP™

for FIB Workflows

TEM / APT / XRM

Laser Micro-Machining for FIB sample preparation for Electron Microscopy, Atom Probe Tomography and X-Ray Microscopy

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CP-8000 Ion Mill Cross Section Polisher for Scanning Electron Microscopes

Ion Mill

Cross Section

Polisher

Cross Section Polisher prepares samples for cross section analysis utilizing an Argon Ion Mill for superior imaging results

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